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Focused Ion Beam Tomography of Porous Titania Thin Films

Published online by Cambridge University Press:  26 July 2009

D Vick ,
KK Krause  and
MJ Brett
D Vick
Affiliation:
National Institute for Nanotechnology,Canada
KK Krause
Affiliation:
University of Alberta,Canada
MJ Brett
Affiliation:
National Institute for Nanotechnology,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 372 - 373
Copyright
Copyright © Microscopy Society of America 2009