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Gold layers characterization by Ion Beam Analytical Techniques: from Semiconductors to cultural heritage artefacts

Published online by Cambridge University Press:  10 September 2015

V. Corregidor  and
L.C. Alves
V. Corregidor*
Affiliation:
IPFN, Campus Tecnológico e Nuclear, Instituto Superior Técnico, Universidade de Lisboa, E.N. 10, 2686-953 Sacavém, Portugal
L.C. Alves
Affiliation:
CFNUL, Centro de Física Nuclear da Universidade de Lisboa, Av. Prof. Gama Pinto, 2, 1649-003 Lisboa, Portugal C2TN, Campus Tecnológico e Nuclear, Instituto Superior Técnico, Universidade de Lisboa, E.N. 10, 2686-953 Sacavém, Portugal
*
email: vicky.corregidor@ctn.ist.utl.pt

Abstract

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Type
Material Sciences
Information
Microscopy and Microanalysis , Volume 21 , Supplement S6: Introduction to the SPMicros Special Issue from the XLVII Annual Congress , August 2015 , pp. 100 - 101
Copyright
Copyright © Microscopy Society of America 2015 

References

[1]Corregidor, V., et al, e-conservation magazine 22, 40–52, 2011.Google Scholar
[2]Zheng, Q., et al, J. Phys. D: Appl. Phys. 45, 175102, 2012.CrossRefGoogle Scholar
[3]Corregidor, V., et al, Nucl. Instrum. Methods B 269, 3049–3053, 2011.CrossRefGoogle Scholar