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Growth of Molybdenum Trioxide Nanoribbons on Oriented Ag and Au Nanostructures: A Scanning Electron Microscopy (SEM) Study

Published online by Cambridge University Press:  18 June 2019

Paramita Maiti*
Affiliation:
Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005, Odisha, India Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400085, India
Arijit Mitra
Affiliation:
School of Basic Sciences, Indian Institute of Technology Bhubaneswar, Argul–Jatni Rd, Kansapada 752050, Odisha, India
R. R. Juluri
Affiliation:
IIIT Ongole, RGUKT-AP, Andhra Pradesh 516330, India
Ashutosh Rath
Affiliation:
Department of Materials Science and Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117575, Singapore
Parlapalli V Satyam
Affiliation:
Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005, Odisha, India Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400085, India
*
*Author for correspondence: Paramita Maiti, E-mail: paramita.maiti1990@gmail.com, paramita@iopb.res.in
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Abstract

We report the growth of molybdenum trioxide (MoO3) nanoribbons (NRs) on epitaxial Ag and oriented Au nanostructures (NSs) using an ultra-high vacuum (UHV)-molecular beam epitaxy (MBE) technique at different substrate temperatures. An approximately 2 nm silver (Ag) film has been deposited at different growth temperatures (using UHV-MBE) on cleaned Si(100), Si(110), and Si(111) substrates. For faceted Au NSs, an approximately 50 nm Au film has been deposited (using high-vacuum thermal evaporation) on a Si(100) substrate with a native oxide layer at the interface and the sample was annealed in low vacuum (≈10−2) and at high temperature (≈975°C). Scanning electron microscopy measurements were performed to determine the morphology of MoO3/Ag and MoO3/Au composite films. From energy dispersive X-ray spectroscopy elemental mapping and line scans it is found that faceted Au NSs are more favorable for the growth of MoO3 NRs than epitaxial Ag microstructures.

Type
Materials Applications
Copyright
Copyright © Microscopy Society of America 2019 

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