Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-28T06:52:30.753Z Has data issue: false hasContentIssue false
  • English
  • Français

Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity Limit

Published online by Cambridge University Press:  10 August 2018

Juliane Reinhardt ,
Andreas Schropp ,
Mikhail Lyubomirskiy ,
Martin Seyrich ,
Dennis Bruckner ,
Thomas F. Keller ,
Vedran Vonk ,
Sergey Volko ,
Andreas Stierle  and
Edvinas Navickas
...Show all authors
Juliane Reinhardt*
Affiliation:
Australian Synchrotron and La Trobe University, Dept. of Chemistry and Physics, Melbourne, Australia Australian Research Council, Centre of Excellence for Advanced Molecular Imaging, Australia
Andreas Schropp
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Mikhail Lyubomirskiy
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Martin Seyrich
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Dennis Bruckner
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Thomas F. Keller
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
Vedran Vonk
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Sergey Volko
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Andreas Stierle
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
Edvinas Navickas
Affiliation:
Technical University Wien, Institute for Chemical Technologies and Analytics, Vienna, Austria
Jürgen. Fleig
Affiliation:
Technical University Wien, Institute for Chemical Technologies and Analytics, Vienna, Austria
Christian G. Schroer
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
*
*Corresponding author: juliane.reinhardt@synchrotron.org.au

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 26 - 27
Copyright
© Microscopy Society of America 2018 

References

[1] Schropp, A., et al., Appl. Phys. Lett. 100, 253112 2012.Google Scholar
[2] Hoppe, R., Reinhardt, J., et al., Appl. Phys. Lett. 102, 203104 2013.CrossRefGoogle Scholar
[3] Reinhardt, J., et al., Ultramicroscopy 173, 52–57, 2017.Google Scholar
[4] Reinhardt, J. Schroer, C.G. JINST 2018) accepted.Google Scholar
[5] Reinhardt, J. PhD thesis 2017.Google Scholar