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High Quality Electron Beams from Laser Wakefield Acceleration: A New Compact Source for Electron Microscopes?

Published online by Cambridge University Press:  01 August 2005

J Mansfield ,
J Nees ,
G Mourou  and
A Galvanauskas
J Mansfield
Affiliation:
University of Michigan
J Nees
Affiliation:
University of Michigan
G Mourou
Affiliation:
L’Ecole Nationale Supéreure de Techniques Avancees - Ecole Polytechnique,France
A Galvanauskas
Affiliation:
University of Michigan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 482 - 483
Copyright
© 2005 Microscopy Society of America