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High Resolution Imaging Using the Oxford Aberration Corrected TEM.

Published online by Cambridge University Press:  31 July 2006

C Hetherington ,
A Kirkland ,
R Doole ,
D Cockayne ,
J Titchmarsh  and
J Hutchison
C Hetherington
Affiliation:
University of Oxford
A Kirkland
Affiliation:
University of Oxford
R Doole
Affiliation:
University of Oxford
D Cockayne
Affiliation:
University of Oxford
J Titchmarsh
Affiliation:
University of Oxford
J Hutchison
Affiliation:
University of Oxford

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1454 - 1455
Copyright
© 2006 Microscopy Society of America