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High Resolution Observations of Interface Dynamics Using a Direct Electron Detection Camera

Published online by Cambridge University Press:  27 August 2014

T. Radetic ,
A. Gautam ,
C. Ophus ,
C. Czarnik  and
U. Dahmen
T. Radetic
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
A. Gautam
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
C. Ophus
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA
C. Czarnik
Affiliation:
Gatan Inc., Pleasanton, California 94588USA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, LBNL, Berkeley California 94720USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1594 - 1595
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Dahmen, U, et al., P. Philos T R Soc A (2009);367:3795.Google Scholar
[2] Merkle, K, Thompson, L, Phillipp, F Interface Sci (2004);12:277.Google Scholar
[3] Trautt, ZT, Upmanyu, M, Karma, A Science (2006);314:632.Google Scholar
[4] Radetic, T, Ophus, C, Olmsted, DL, Asta, M, Dahmen, U Acta Materialia (2012);60:7051.Google Scholar
[5] Johnson, Ε, Prokofjev, S, Zhilin, V, Dahmen, U Z Metallkd (2005);96:1171.Google Scholar
[6] The National Center for Electron Microscopy at LBNL is supported by the U.S. Department of Energy under Contract # DE-AC02-05CH11231.Google Scholar