Hostname: page-component-7bb8b95d7b-2h6rp Total loading time: 0 Render date: 2024-09-28T07:05:35.994Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film

Published online by Cambridge University Press:  09 October 2013

L. Fang ,
P. Ricou  and
R. Korotkov
L. Fang
Affiliation:
P. Ricou
Affiliation:
R. Korotkov
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1958 - 1959
Copyright
Copyright © Microscopy Society of America 2013