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High Speed Accurate Quantification with X-Max Large Area Silicon Drift Detectors

Published online by Cambridge University Press:  01 August 2010

S Burgess ,
C Collins ,
J Holland  and
N Rowlands
S Burgess
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
C Collins
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
J Holland
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
N Rowlands
Affiliation:
Oxford Instruments NanoAnalysis USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1320 - 1321
Copyright
Copyright © Microscopy Society of America 2010