No CrossRef data available.
Article contents
High-resolution Multimodal Confocal Raman-imaging in SEM by Means of RISE Microscopy
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Vendor Symposium - Imaging
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Schmidt, R.; Fitzek, H.; Nachtnebel, M.; Mayrhofer, C.; Schroettner, H.; Zankel, A., The Combination of Electron Microscopy, Raman Microscopy and Energy Dispersive X-Ray Spectroscopy for the Investigation of Polymeric Materials. Macromolecular Symposia 2019, 384 (1), 180023710.1002/masy.201800237CrossRefGoogle Scholar
Wille, G.; Lerouge, C.; Schmidt, U., A multimodal microcharacterisation of trace-element zonation and crystallographic orientation in natural cassiterite by combining cathodoluminescence, EBSD, EPMA and contribution of confocal Raman-in-SEM imaging. Journal of Microscopy 2018, 270, 309-317.10.1111/jmi.12684CrossRefGoogle ScholarPubMed
Schmidt, U.; Hollricher, K.; Ayasse, P.; Hollricher, O., Correlative RISE microscopy: Raman imaging meets scanning electron probe microscopy. Microscopy and Analysis 2015, 29 (3), 24-27.Google Scholar
Stolcova, L.; Prosika, J.; Vana, R.; Dluhos, J., Correlative RISE microscopy and 3D reconstruction. Imaging & Microscopy 2015, 17.Google Scholar
Schmidt, U.; Liu, W.; Yang, J.; Dieing, T.; Weishaupt, K., The power of confocal raman-AFM and raman-SEM (RISE) imaging in polymer research. In Microscopy and Microanalysis, 2015; Vol. 21, pp 2189-2190.10.1017/S1431927615011721CrossRefGoogle Scholar
You have
Access