Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-27T02:53:08.510Z Has data issue: false hasContentIssue false
  • English
  • Français

High-speed Three-dimensional Imaging at the Nanoscale via Fly-scan Ptycho-tomography

Published online by Cambridge University Press:  30 July 2020

Yi Jiang ,
Junjing Deng ,
Jeffrey Klug ,
Yudong Yao ,
Curt Preissner ,
Christian Roehrig ,
Fabricio Marin ,
Zhenjiang Yu ,
Jiajun Wang  and
Zhonghou Cai
...Show all authors
Yi Jiang
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Junjing Deng
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Jeffrey Klug
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Yudong Yao
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Curt Preissner
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Christian Roehrig
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Fabricio Marin
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Zhenjiang Yu
Affiliation:
Harbin Institute of Technology, Harbin, Heilongjiang, China (People's Republic)
Jiajun Wang
Affiliation:
Harbin Institute of Technology, Harbin, Heilongjiang, China (People's Republic)
Zhonghou Cai
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Barry Lai
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Stefan Vogt
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1006 - 1008
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Holler, M. et al. , Nature 543 (2017), p.402–406.10.1038/nature21698CrossRefGoogle Scholar
Holler, M. et al. , Nature Electronics 2 (2019), p.464–470.10.1038/s41928-019-0309-zCrossRefGoogle Scholar
Pelz, P. M. et al. , Applied Physics Letters 105, 251101 (2014).10.1063/1.4904943CrossRefGoogle Scholar
Deng, J. et al. , Optics Express 23 (2015), p.5438–5451.10.1364/OE.23.005438CrossRefGoogle Scholar
Clark, J. N. et al. , Optical Letters 39 (2014), p.6066–6069.10.1364/OL.39.006066CrossRefGoogle Scholar
Odstrcil, M. et al. , Optics Express 26(3), (2018), p.3180-3123.Google Scholar
Deng, J. et al. , Review of Scientific Instruments 8(90) (2019).Google Scholar
Odstrcil, M. et al. , Optics Express 27(25), (2019), p.36637–36652.10.1364/OE.27.036637CrossRefGoogle Scholar
This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.Google Scholar