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High-speed Three-dimensional Imaging at the Nanoscale via Fly-scan Ptycho-tomography

Published online by Cambridge University Press:  30 July 2020

Yi Jiang ,
Junjing Deng ,
Jeffrey Klug ,
Yudong Yao ,
Curt Preissner ,
Christian Roehrig ,
Fabricio Marin ,
Zhenjiang Yu ,
Jiajun Wang  and
Zhonghou Cai
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Yi Jiang
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Junjing Deng
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Jeffrey Klug
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Yudong Yao
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Curt Preissner
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Christian Roehrig
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Fabricio Marin
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Zhenjiang Yu
Affiliation:
Harbin Institute of Technology, Harbin, Heilongjiang, China (People's Republic)
Jiajun Wang
Affiliation:
Harbin Institute of Technology, Harbin, Heilongjiang, China (People's Republic)
Zhonghou Cai
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Barry Lai
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Stefan Vogt
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States

Abstract

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Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1006 - 1008
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Copyright
Copyright © Microscopy Society of America 2020

References

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This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.Google Scholar