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History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale

Published online by Cambridge University Press:  04 August 2017

Hideyuki Takahashi ,
Hiroyuki Yamada ,
Satoshi Notoya ,
Masaru Takakura ,
Takanori Murano ,
Vernon Robertson  and
Peter McSwiggen
Hideyuki Takahashi
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Hiroyuki Yamada
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Satoshi Notoya
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Masaru Takakura
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Takanori Murano
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-chome, Akishima, Tokyo, Japan.
Peter McSwiggen
Affiliation:
JEOL USA, 11 Dearborn Rd. Peabody, MA, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1018 - 1019
Copyright
© Microscopy Society of America 2017 

References

[1] “Souzou to Kaihatsu” (Japanese), Creation and Development in JEOL Ltd. 60 Year Anniversary” (2010).Google Scholar
[2] Reed, J. B. “Electron Microprobe Analysis second edition”, (Cambridge University Press).Google Scholar
[3] Terauchi, M., et al, J. Electron Microscopy 61 2012). p. 1.Google Scholar
[4] MacRae, C.M., et al, Microscopy & Microanalysis 22(S3 2016). p. 410.Google Scholar