Hostname: page-component-7479d7b7d-767nl Total loading time: 0 Render date: 2024-07-12T15:50:10.629Z Has data issue: false hasContentIssue false
  • English
  • Français

HRTEM and EELS Study in GaN-based Diluted Magnetic Semiconductor

Published online by Cambridge University Press:  01 August 2005

R T Huang ,
C F Hsu ,
J J Kai ,
F R Chen  and
T S Chin
R T Huang
Affiliation:
National Tsing-Hua University,Republic of China,Taiwan
C F Hsu
Affiliation:
National Tsing-Hua University,Republic of China,Taiwan
J J Kai
Affiliation:
National Tsing-Hua University,Republic of China,Taiwan
F R Chen
Affiliation:
National Tsing-Hua University,Republic of China,Taiwan
T S Chin
Affiliation:
National Tsing-Hua University,Republic of China,Taiwan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1818 - 1819
Copyright
© 2005 Microscopy Society of America