Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-19T18:01:51.717Z Has data issue: false hasContentIssue false
  • English
  • Français

Identification of Structure and Chemical Occupancy of Emerging Complex Compounds via Analytical Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Chi Zhang ,
Roberto dos Reis ,
Steven Flynn ,
Kenneth Poeppelmeier  and
Vinayak Dravid
Chi Zhang
Affiliation:
Northwestern University, Evanston, Illinois, United States
Roberto dos Reis
Affiliation:
Northwestern University, Evanston, Illinois, United States
Steven Flynn
Affiliation:
Northwestern University, Evanston, Illinois, United States
Kenneth Poeppelmeier
Affiliation:
Northwestern University, Evanston, Illinois, United States
Vinayak Dravid
Affiliation:
Northwestern University, Evanston, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 744 - 746
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Wells, A. F. Structural Inorganic Chemistry; OUP Oxford, 2012.Google Scholar
Rickert, K.; Sedefoglu, N.; Malo, S.; Caignaert, V.; Kavak, H.; Poeppelmeier, K. R. Structural, Electrical, and Optical Properties of the Tetragonal, Fluorite-Related Zn 0.456 In 1.084 Ge 0.460 O 3. Chemistry of Materials 2015, 27 (14), 5072–5079.10.1021/acs.chemmater.5b01724CrossRefGoogle Scholar
Flynn, S.; Adekoya, A. J.; Saeed, S.; Zhang, C.; Dravid, V. P.; Gonzalez, G. B.; Poeppelmeier, K. R. (Cu x Zn 1– x ) 0.456 In 1.084 Ge 0.46 O 3 (0 ≤ x ≤ 1): A Complex, Ordered, Anion-Deficient Fluorite with Unusual Site-Specific Cation Mixing. Inorg. Chem. 2019, 58 (22), 15610–15617.10.1021/acs.inorgchem.9b02692CrossRefGoogle Scholar
Tanaka, M. Convergent-Beam Electron Diffraction. 1994, 50 (3), 261–286.Google Scholar
Tanaka, M.; Tsuda, K. Convergent-Beam Electron Diffraction. Microscopy 2011, 60 (suppl 1), S245–S267.10.1093/jmicro/dfr038CrossRefGoogle ScholarPubMed
Zuo, J. M. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience; Springer: New York, NY, 2017.10.1007/978-1-4939-6607-3CrossRefGoogle Scholar
Gjønnes, J.; Moodie, A. F. Extinction Conditions in the Dynamic Theory of Electron Diffraction. Acta Cryst 1965, 19 (1), 65–67.10.1107/S0365110X65002773CrossRefGoogle Scholar
This work was supported by MRSEC program (NSF DMR-1720139), made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois, through the IIN.Google Scholar