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Imaging Extended Defects by TEM
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1020 - 1021
- Copyright
- Copyright © Microscopy Society of America 2014
References
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[6] Thanks to Sandia National Laboratory where CBC is a CINT Distinguished Affiliate Scientist, and to Doug Medlin, Jim Ciston and Yoosuf Picard for the invitation to present this work. Personal thanks to my former group members and many collaborators (who are listed on the web site
www. CBarryCarter. com). Special thanks go to Grant Norton and Dave Williams, co-authors of our two textbooks.Google Scholar