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Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges

Published online by Cambridge University Press:  05 August 2019

G. Naresh-Kumar ,
A. Alasamari ,
Ben Hourahine  and
C. Trager-Cowan
G. Naresh-Kumar*
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
A. Alasamari
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
Ben Hourahine
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
C. Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
*
*Corresponding author: naresh.gunasekar@strath.ac.uk

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1760 - 1761
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zaefferer, S. and Elhami, N-N., Acta Materialia 75 (2014), p. 20.Google Scholar
[2]Naresh-Kumar, G. et al. , Materials Science in Semiconductor Processing 47, (2016), p. 44.Google Scholar
[3]Kriaa, H., Guitton, A. and Maloufi, N. Scientific Reports 7, (2017), p. 9742.Google Scholar
[4]Danilatos, G. D. Journal of Microscopy, 245 (2012) p. 171.Google Scholar
[5]The authors acknowledge support from the EPSRC grant; “Quantitative non-destructive nanoscale characterisation of advanced materials” (EP/P015719/1).Google Scholar