Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-27T18:47:28.475Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging the spatial distribution of π* states in graphene using aberration-corrected and monochromated STEM-EELS: towards orbital mapping

Published online by Cambridge University Press:  30 July 2021

Matthieu Bugnet ,
Manuel Ederer ,
Vlado Lazarov ,
Quentin Ramasse ,
Stefan Löffler  and
Demie Kepaptsoglou
Matthieu Bugnet
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury WA4 4AD, United Kingdom, United States
Manuel Ederer
Affiliation:
University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria, United States
Vlado Lazarov
Affiliation:
Department of Physics, University of York, YorkYO10 5DD, United Kingdom, United States
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, DaresburyWA4 4AD, United Kingdom, Darebury, United Kingdom
Stefan Löffler
Affiliation:
University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria, Wien, Austria
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury WA4 4AD, United Kingdom, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Quantum Materials Probed by High Spatial and Energy Resolution in Scanning/Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 134 - 135
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Löffler, S., Bugnet, M., et al. Ultramicroscopy 177, 26 (2017).CrossRefGoogle Scholar
Pardini, L., Löffler, S., et al. Physical Review Letters 117, 036801 (2016).CrossRefGoogle Scholar
Liu, Y., Li, Y. Y., et al. Nature Physics 10, 294 (2014).CrossRefGoogle Scholar
Löffler, S., Motsch, V., and Schattschneider, P., Ultramicroscopy 131, 39 (2013).CrossRefGoogle Scholar
The electron microscopy work was supported by the EPSRC (UK). SuperSTEM Laboratory is the EPSRC National Research Facility for Advanced Electron Microscopy. The authors would like to thank Prof. Lian Li (West Virginia University) for the provision of the specimen, as well as Hitachi High Technologies, and Orsay Physics and Tescan, for the preparation of FIB lamellae. MB is grateful to the SuperSTEM Laboratory for microscope access, and to the School of Chemical and Process Engineering at the University of Leeds for a visiting associate professorship and financial support. ME and SL acknowledge funding from the Austrian Science Fund (FWF) under grant nr. I4309-N36.Google Scholar