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Impact of Electron Energy and Dose on Particle Dynamics Imaging in the Scanning Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Yige Gao ,
Satyam Srivastava ,
Paul Y. Kim ,
David A. Hoagland ,
Thomas P. Russell  and
Alexander E. Ribbe
Yige Gao
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Satyam Srivastava
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Paul Y. Kim
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, United States.
David A. Hoagland
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Thomas P. Russell
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, United States.
Alexander E. Ribbe*
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
*
*Corresponding author: aeribbe@umass.edu

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1670 - 1671
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chen, Q.; Smith, J. M.; Park, J.; Kim, K.; Ho, D.; Rasool, H. I.; Zettl, A.; Alivisatos, A. P. Nano Lett. 2013, 13, 4556−4561.Google Scholar
[2]de Jonge, N.; Ross, F. M. Nat. Nanotechnol. 2011, 6, 695−704.Google Scholar
[3]Mansfeld, U.; Hoeppener, S.; Schubert, U. S. Adv. Mater. 2013, 25, 761−765.Google Scholar
[4]Zheng, H.; Mirsaidow, U.M.; Wang, L.-W.; Matsudaira, P. Nano Lett. 2012, 12, 5644-5648.Google Scholar
[5]Powers, A.S.; Liao, H.-G.; Raja, S.N.; Bronstein, N.D. Alivisatos, A.P.; Zheng, H. Nano Lett. 2017, 17, 15-20.Google Scholar
[6]Kim, P. Y.; Ribbe, A. E.; Russell, T. P.; Hoagland, D. A. ACS Nano 2016, 10, 6257−6264.Google Scholar
[7]Kim, P. Y.; Gao, Y.; Chai, Y.; Ashby, D.P.; Ribbe, A. E.; Russell, T. P.; Hoagland, D. A. ACS Nano, 2019 ASAP DOI: 10.1021/acsnano.8b08189Google Scholar