Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-30T19:23:34.532Z Has data issue: false hasContentIssue false
  • English
  • Français

Impact of Sample Thickness on Atomic Resolution Tomography by HAADF-STEM

Published online by Cambridge University Press:  31 July 2006

DO Klenov  and
S Stemmer
DO Klenov
Affiliation:
University of California,Santa Barbara
S Stemmer
Affiliation:
University of California,Santa Barbara

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1564 - 1565
Copyright
© 2006 Microscopy Society of America