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The Importance of the σ-hole in the Self-Assembly of Halogenated Polypeptoids

Published online by Cambridge University Press:  22 July 2022

Morgan Seidler ,
Nan K. Li ,
Xubo Luo ,
Sunting Xuan ,
David Prendergast ,
Ronald N. Zuckermann ,
Nitash P. Balsara  and
Xi Jiang
Morgan Seidler
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Department of Chemical and Biomolecular Engineering, University of California, Berkeley, CA, USA
Nan K. Li
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Xubo Luo
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Sunting Xuan
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
David Prendergast
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Ronald N. Zuckermann
Affiliation:
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Nitash P. Balsara*
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Department of Chemical and Biomolecular Engineering, University of California, Berkeley, CA, USA
Xi Jiang*
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
*
*Corresponding author: xijiang@lbl.gov; nbalsara@berkeley.edu
*Corresponding author: xijiang@lbl.gov; nbalsara@berkeley.edu

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2206 - 2208
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Copyright
Copyright © Microscopy Society of America 2022

References

Mukherjee, A., et al. , Acc. Chem. Res. 47 (2014), p. 2514.10.1021/ar5001555CrossRefGoogle Scholar
Xuan, S., et al. , PNAS 116 (2019), p. 22491.10.1073/pnas.1909992116CrossRefGoogle Scholar
Jiang, X., et al. , Soft Matter 15 (2019), p. 4723.Google Scholar
Gipson, B., et al. , J. Struct. Biol 157 (2007), p. 64.10.1016/j.jsb.2006.07.020CrossRefGoogle Scholar
Scheres, S.H.W., J. Struct. Biol 180 (2012), p. 519.10.1016/j.jsb.2012.09.006CrossRefGoogle Scholar
Ibrahim, M. A. A., J. Comput. Chem 32 (2011), p. 2564.10.1002/jcc.21836CrossRefGoogle Scholar
Soft Matter Electron Microscopy Program (KC11BN), supported by the Office of Science, Office of Basic Energy Science, US Department of Energy, under Contract DE-AC02-05CH11231. M.S. acknowledges funding from the National Science Foundation Graduate Student Research Fellowship DGE 1752814.Google Scholar