Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-26T14:44:52.780Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope

Published online by Cambridge University Press:  23 September 2015

Takeo Sasaki ,
Hidetaka Sawada ,
Eiji Okunishi ,
Yu Jimbo ,
Yorinobu Iwasawa ,
Koji Miyatake ,
Shuichi Yuasa  and
Toshikatsu Kaneyama

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1861 - 1862
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Kawai, S, et al, Microsc. Microanal. 20(Suppl. 3 (2014) 1150–1151.CrossRefGoogle Scholar
[2] Sawada, H, etal, Microsc. Microanal. 20(Suppl. 3 (2014) 124–125.CrossRefGoogle Scholar