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Improving Sensitivity and Productivity with High count rate X-ray spectrum images

Published online by Cambridge University Press:  04 August 2017

Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Matthew Hiscock
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

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Abstract
Copyright
© Microscopy Society of America 2017