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Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements

Published online by Cambridge University Press:  23 September 2015

John J. Donovan  and
John T. Armstrong
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, 97403
John T. Armstrong
Affiliation:
Carnegie Institution for Science, Geophysical Lab, Washington, DC, NW, 20015-1305

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1445 - 1446
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Donovan, JJ, Lowers, HA & Rusk, BG (2011). Improved Electron Probe Microanalysis of Trace Elements in Quartz. American Mineralogist 96, 274–282.CrossRefGoogle Scholar
[2] Donovan, JJ & Tingle, T (1996). An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis, Jour. of Micros. Microanal, 1–7.Google Scholar
[3] Armstrong, JT (1988). Quantitative Analysis of Silicate and Oxide Materials: Comparison of Monte Carlo, ZAF, and Procedures. Microbeam Analysis, 239–246.Google Scholar