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In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[6]This material is based upon work supported by the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503.Google Scholar
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