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In situ TEM Measurements of Ion Irradiation Induced Creep

Published online by Cambridge University Press:  05 August 2019

Gowtham S. Jawaharram ,
Christopher Barr ,
Patrick Price ,
Khalid Hattar  and
Shen J. Dillon
Gowtham S. Jawaharram
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Christopher Barr
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA.
Patrick Price
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA.
Khalid Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA.
Shen J. Dillon*
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
*
*Corresponding author: sdillon@illinois.edu

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1566 - 1567
Copyright
Copyright © Microscopy Society of America 2019 

References

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[12]This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government. G.J. and S.J.D. would like to acknowledge US DOE Office of Basic Energy Sciences, under Grant DEFG02-05ER46217.Google Scholar