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Increasing Resolution of X-ray Imaging at High Acceleration Voltages

Published online by Cambridge University Press:  22 July 2022

Emil Espes  and
Anasuya Adibhatla
Emil Espes*
Affiliation:
Excillum AB, Kista, Sweden
Anasuya Adibhatla
Affiliation:
Excillum Inc, Boston, MA, United States
*
*Corresponding author: emil.espes@excillum.com

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 234
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Copyright
Copyright © Microscopy Society of America 2022

References

Fella, C et al. , Microscopy and Microanalysis 24 (S2) (2018), p. 234.CrossRefGoogle Scholar
Ferstl, S et al. , IEEE Transactions on Medical Imaging 1-1 (2019)Google Scholar
CT-ALPHA nanotube, https://www.procon-x-ray.com/ct-alpha-nanotube/ (February 24, 2022)Google Scholar