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In-Depth Sample Analysis with a Signal-Selective SEM Detection System

Published online by Cambridge University Press:  25 July 2016

M. Havelka ,
J. Jiruše ,
P. Mareš  and
J. Kolosova
M. Havelka
Affiliation:
TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic
J. Jiruše
Affiliation:
TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic
P. Mareš
Affiliation:
TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic
J. Kolosova
Affiliation:
TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 626 - 627
Copyright
© Microscopy Society of America 2016 

References

References:

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[5] Reimer, L in Scanning Electron Microscopy (ed. H K V Lotsch, (Springer Verlag, Berlin)) p. 222.Google Scholar