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The Influence of Time-of-Flight (TOF) Mass Spectra Peak Resolution on Elemental Detection Limits for Atom Probe Instrumentation

Published online by Cambridge University Press:  01 August 2005

P H Clifton ,
A Cerezo  and
G N F Chapman
P H Clifton
Affiliation:
Oxford nanoScience Ltd
A Cerezo
Affiliation:
Oxford University
G N F Chapman
Affiliation:
Oxford nanoScience Ltd

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 880 - 881
Copyright
© 2005 Microscopy Society of America