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In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

Published online by Cambridge University Press:  26 July 2009

Z Zhang  and
X Han
Z Zhang
Affiliation:
Beijing University of Technology
X Han
Affiliation:
Beijing University of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1182 - 1183
Copyright
Copyright © Microscopy Society of America 2009