Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T23:47:49.819Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Characterization of 2-Dim Materials at High Energy and Spatial Resolution

Published online by Cambridge University Press:  07 February 2019

Jacob R. Jokisaari ,
Jordan Hachtel ,
Xuan Hu ,
Arijita Mukherjee ,
Canhui Wang ,
Andrea Konecna ,
Javier Aizpurua ,
Ondrej L. Krivanek ,
Juan-Carlos Idrobo  and
Robert F. Klie
Jacob R. Jokisaari
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Jordan Hachtel
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Science, Oak Ridge, TN 37831.
Xuan Hu
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Arijita Mukherjee
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Canhui Wang
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Andrea Konecna
Affiliation:
Center for Material Physics, Donostia - San Sebastian Gipuzkoa 20018Spain.
Javier Aizpurua
Affiliation:
Center for Material Physics, Donostia - San Sebastian Gipuzkoa 20018Spain.
Ondrej L. Krivanek
Affiliation:
Nion Company, 11511 NE 118th St., Kirkland, WA 98034.
Juan-Carlos Idrobo
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Science, Oak Ridge, TN 37831.
Robert F. Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Studying Material Reactions with In-Situ Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 17 - 18
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

**

now at: National Institute of Standards and Technology

References

References:

[1]Standley, B et al. , Nano Lett 8 (2008), 3345.Google Scholar
[2]Wang, C et al. , Appl Mat 26 (2014), 3410.Google Scholar
[3]Hu, X et al. , Phys Rev Lett 120(5) (2018), 055902.Google Scholar
[4]Wang, C et al. , Adv Mat 28(35) (2016), 7716.Google Scholar
[5]Krivanek, OL et al. , Nature 514 (2014), 209.Google Scholar
[6]This work was in part supported by the National Science Foundation (EFMA-1542864 (EFRI)).Google Scholar