Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-18T22:17:05.336Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ EBIC STEM: Automated Quantification

Published online by Cambridge University Press:  22 July 2022

Grigore Moldovan ,
Aidan P. Conlan  and
David Cooper
Grigore Moldovan
Affiliation:
point electronic GmbH, Halle (Saale), Saxony-Anhalt, Germany
Aidan P. Conlan*
Affiliation:
Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
David Cooper
Affiliation:
Univ. Grenoble Alpes, CEA, LETI, Grenoble, France
*
*Corresponding author: grigore.moldovan@pointelectronic.de

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1718 - 1719
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Leamy, H, J. Appl. Phys. 53(6) (1982)CrossRefGoogle Scholar
Marcelot, Maximenko, Magnan, IEEE 61 (2014)Google Scholar
Yakimov, EB, et al. , J. Appl. Phys. 123 (2018), p. 161543.Google Scholar
Han, MG et al. , Ultramicroscopy 176 (2017), p. 80.CrossRefGoogle Scholar
Hubbard, WA, et al., Phys. Rev. Applied 10 (2018), p. 044066CrossRefGoogle Scholar
Moldovan, G and Zabel, M, Microscopy and Microanalysis 26(S2) (2020)CrossRefGoogle Scholar
Conlan, AP, et al. , J. Appl. Phys. 129 (2021), p. 135701CrossRefGoogle Scholar
The authors acknowledge financial support of the Cross-Disciplinary Program on Instrumentation and Detection of CEA, and “Recherches Technologiques de Base” Program of the French Ministry of Research.Google Scholar