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In-Situ TEM Investigation of Controlled VLS Silicon Nanowire Device Formation and Characterization
Published online by Cambridge University Press: 21 December 2016
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S5: Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , November 2016 , pp. 60 - 61
- Copyright
- © Microscopy Society of America 2016
References
[6]
Panciera, F., et al, Nature Communications
7, 12271. doi: 10.1038/ncomms12271
2016.CrossRefGoogle Scholar
[7] Supported by ERC Grant 279342: InSituNANO and EPSRC Grant EP/P005152/1 (F.P., S.H.), by the National Science Foundation CBET 1066573 and the Nano/Bio Interface Center through the National Science Foundation NSEC DMR08-32802 (M.M.N.), and The Danish Council for Independent Research, Case No.10-083797 (S.B.A., K.M.). The authors acknowledge Jerry D. Tersoff and Haim H. Bau for fruitful discussions and Mark C. Reuter, Arthur W. Ellis and Eric Jensen for technical support.Google Scholar