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In-Situ Transmission Electron Microscopy Investigation on the Vapor-Solid Growth of ZnO Nanowires

Published online by Cambridge University Press:  05 August 2019

Xing Li ,
Shaobo Cheng ,
Jing Zhu  and
Qing Chen
Xing Li*
Affiliation:
Key Laboratory of Material Physics, Ministry of Education, Department of Physics and Engineering, Zhengzhou University, Zhengzhou, P. R. China
Shaobo Cheng
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA
Jing Zhu
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing, P. R. China
Qing Chen
Affiliation:
Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing, P. R. China
*
*Corresponding author: xingli@zzu.edu.cn

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1542 - 1543
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Huang, M. H., et al. , Science 292 (2001), p.1897.Google Scholar
[2]Li, X., et al. , Adv. Mater. Interfaces 6 (2018), 1701246.Google Scholar
[3]Li, X., et al. , Nanomaterials 8 (2018), 188.Google Scholar
[4]Wan, Q., et al. , Appl. Phys. Lett. 84 (2004), 3654.Google Scholar
[5]Meyer, B. and Marx, D., Phys. Rev. B 67 (2003), 035403.Google Scholar
[6]The authors acknowledge funding from National Science Foundation of China (No.11804304) and China Postdoctoral Science Foundation (2017M622371).Google Scholar