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In-situThermal Testing on Nanostructures in TEM

Published online by Cambridge University Press:  25 July 2016

Hua Guo
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA
Will J. Hardy
Affiliation:
Applied Physics Graduate Program, Smalley-Curl Institute, Rice University, Houston, Texas, USA
Panpan Zhou
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Douglas Natelson
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Jun Lou
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Hobbs, L.W. in “Introduction to Analytical Electron Microscopy”. Plenum (1979).Google Scholar
[2] Gao, Y. & Bando, Y. Nature 415 (2002). p. 599.CrossRefGoogle Scholar
[3] Brintlinger, T., Qi, Y., Baloch, K.H., Goldhaber-Gordon, D. & Cumings, J. Nano Lett. 8 (2008). p. 582.CrossRefGoogle Scholar
[4] Shi, L., et al., J. Appl. Phys. 105 (2009). p. 104306.CrossRefGoogle Scholar
[5] Mecklenburg, M., et al., Science 347 (2015). p. 629.CrossRefGoogle Scholar
[6] Eyert, V. Annalen der Physik 11 (2002). p. 650.CrossRefGoogle Scholar
[7] Guo, H., et al., Appl. Phys. Lett 102 (2013). p. 231909.CrossRefGoogle Scholar