No CrossRef data available.
Article contents
Instrumentation/Technique Developments in Gareth Thomas’s Research Group
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927616006954/resource/name/firstPage-S1431927616006954a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1222 - 1223
- Copyright
- © Microscopy Society of America 2016
References
References:
[1] Workshop on High Resolution Electron Microscopy - Final Report. G. Thomas, R.M. Glaeser, J. M. Cowley, R. Sinclair, JOM (Journal of The Minerals, Metals & Materials Soc.) 29 (1977) 16.CrossRefGoogle Scholar
[3]
Krivanek, O.L., et al,
in
The Physics of SiO2 and its interfaces. Pergamon Press
(1978)
356–361.Google Scholar
[6]
Batson, P.E., et al,
Nature
418 (2002) 617-620; P.D. Nellist et al., Science
305 (2004) 1741.Google Scholar