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Introduction to the Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy

Published online by Cambridge University Press:  07 February 2019

Niels de Jonge ,
Kristian Mølhave  and
Damien Alloyeau
Niels de Jonge
Affiliation:
INM – Leibniz Institute for New Materials, D-66123 Saarbrücken, Germany Department of Physics, Saarland University, D-66123 Saarbrücken, Germany
Kristian Mølhave
Affiliation:
Technical University of Denmark, Lyngby, Denmark
Damien Alloyeau
Affiliation:
CNRS / University Paris-Diderot, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 1 - 2
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]de Jonge, N, Mølhave, K and Alloyeau, D, Microsc Microanal 22 S5 (2016), p. 1.Google Scholar
[2]We thank Eduard Arzt for his support through INM and Christine Hartmann who took care of the entire conference organization.Google Scholar