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Investigation of Bi Segregation of Cu Bicrystal Boundaries Using Aberration-Corrected STEM Depth Sectioning

Published online by Cambridge University Press:  27 August 2014

C. A. Wade  and
M. Watanabe
C. A. Wade
Affiliation:
Materials Science and Engineering Department Lehigh University, Bethlehem, PA
M. Watanabe
Affiliation:
Materials Science and Engineering Department Lehigh University, Bethlehem, PA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1080 - 1081
Copyright
Copyright © Microscopy Society of America 2014 

References

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[8] The authors wish to acknowledge financial support from the NSF through grants DMR-0804528and DMR-1040229.Google Scholar