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Investigation of Solid-state Chemical Lithiation of Single Crystalline Silicon Thin Window Anodes by Analytical Scanning and Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Vladimir Oleshko ,
Saya Takeuchi  and
Emily Bittle
Vladimir Oleshko
Affiliation:
NIST, Gaithersburg, Maryland, United States
Saya Takeuchi
Affiliation:
Theiss Research, La Jolla, California, United States
Emily Bittle
Affiliation:
NIST, Gaithersburg, Maryland, United States

Abstract

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Type
In Situ TEM at the Extremes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1448 - 1450
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Copyright
Copyright © Microscopy Society of America 2020

References

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