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Ion Beam Induced Artifacts in Lead Based Chalcogenides
Published online by Cambridge University Press: 05 August 2019
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- The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
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- Copyright © Microscopy Society of America 2019
References
[4]This material is based upon work supported by U. S. Department of Energy, Office of Science, and Office of Basic Energy Sciences under Award Number DE-SC-0014520. This work made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois, through the IIN.Google Scholar
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