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Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[7]The authors acknowledge funding from JST SENTAN, KAKENHI JSPS Grant No. JP17H01316 and Grant-in-Aid for Specially Promoted Research “Atom-by-atom imaging of ion dynamics in nano-structures for materials innovation” (Grant No. JP17H06094).Google Scholar