Hostname: page-component-84b7d79bbc-c654p Total loading time: 0 Render date: 2024-07-28T10:17:43.917Z Has data issue: false hasContentIssue false
  • English
  • Français

Local Strain Analysis using Scanning Nanobeam Electron Diffraction during In Situ TEM Nanomechanical Testing

Published online by Cambridge University Press:  01 August 2018

Andrew M. Minor
Andrew M. Minor*
Affiliation:
Department of Materials Science & Engineering, University of California, Berkeley, and the National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 964 - 965
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Ozdol, V. B., et al, Applied Physics Letters 106 2015) p. 253107.Google Scholar
[2] Gammer, C., et al, Applied Physics Letters 109 2016) p. 081906.Google Scholar
[3] Pekin, T. C., et al, Ultramicroscopy 176 2017) p. 170.Google Scholar
[4] Pekin, T. C., et al, Scripta Materialia 146 2018) p. 87.Google Scholar
[5] Work at the Molecular Foundry is supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231..Google Scholar