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Low Angle Annular Dark Field Scanning Transmission Electron Microscopy is Sensitive to Oxidation State in CeO2 Nanoparticles

Published online by Cambridge University Press:  23 September 2015

Aaron C. Johnston-Peck ,
Jonathan P. Winterstein ,
Alan D. Roberts ,
Joseph S. DuChene ,
Kun Qian ,
Brendan C. Sweeny ,
Wei David Wei ,
Renu Sharma ,
Eric A. Stach  and
Andrew A. Herzing
Aaron C. Johnston-Peck
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA
Jonathan P. Winterstein
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899 USA
Alan D. Roberts
Affiliation:
Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 USA
Joseph S. DuChene
Affiliation:
Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 USA
Kun Qian
Affiliation:
Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 USA
Brendan C. Sweeny
Affiliation:
Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 USA
Wei David Wei
Affiliation:
Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 USA
Renu Sharma
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899 USA
Eric A. Stach
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11793 USA
Andrew A. Herzing
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 239 - 240
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Trovarelli, A., Cat. Rev. - Sci. Eng 38 (1996). p 439.Google Scholar
[2] Turner, S., et al., Nanoscale 3 (2011). p 3385.CrossRefGoogle Scholar
[2] A.C.J.P. acknowledges support of the National Research Council Postdoctoral Research Associateship Program. W.D.W., J.S.D., K.Q., and B.C.S thank NSF for support under Grant DMR-1352328-CAREER and the CCI Center for Nanostructured Electronic Materials (CHE-1038015). A.D.R. acknowledges the University of Florida Howard Hughes Medical Institute Intramural Award. The research carried out at the Center for Functional Nanomaterials (Brookhaven National Laboratory) was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No.DE-AC02-98CH10886.Google Scholar