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Low Temperature Electron Microscopy and Manipulation of Electronic Order

Published online by Cambridge University Press:  30 July 2020

Ismail El Baggari ,
David Baek ,
Michael Zachman  and
Lena Kourkoutis
Ismail El Baggari
Affiliation:
Cornell University, Ithaca, New York, United States
David Baek
Affiliation:
Cornell University, Ithaca, New York, United States
Michael Zachman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Lena Kourkoutis
Affiliation:
Cornell University, Ithaca, New York, United States

Abstract

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Type
In situ TEM at the Extremes - Extreme Temperature and Biasing
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2028 - 2030
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Copyright
Copyright © Microscopy Society of America 2020

References

El Baggari, I., et al. , Proc. Natl. Acad. Sci. 115 (2018), p. 1445–1450.10.1073/pnas.1714901115CrossRefGoogle Scholar
Savitzky, B. H., et al. , Ultramicroscopy 191 (2018), p. 56–65.10.1016/j.ultramic.2018.04.008CrossRefGoogle Scholar
Goodge, B. H., et al. , arXiv:2001.11581.Google Scholar
Efremov, D.V., et al. , Nature Materials 3 (2004), p. 853–856.10.1038/nmat1236CrossRefGoogle Scholar
Radaelli, P. G., et al. , Phys. Rev. B 59 (1999), p. 14440.10.1103/PhysRevB.59.14440CrossRefGoogle Scholar
Zong, A., et al. , Science Advances 4 (2018), eaau550.10.1126/sciadv.aau5501CrossRefGoogle Scholar
This work was supported by AFOSR (FA 9550-16-1-0305) and NSF (DMR-1539918, DMR-1429155, DMR-1719875). We acknowledge Di Lu, Yasuyuki Kawasaki, Elizabeth A. Nowadnick, Harold Hwang, Anshul Kogar, Alfred Zong and Nuh Gedik for their contribution.Google Scholar