No CrossRef data available.
Article contents
Low Voltage Analytical Possibilities in a Scanning Electron Microscope in Transmission Mode at 30 kV: EDS, EELS and CBED at the Nanoscale
Published online by Cambridge University Press: 01 August 2018
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2036 - 2037
- Copyright
- © Microscopy Society of America 2018
References
References:
[1] Demers, H., Brodusch, N.
Gauvin, R. (2017) Microscopy and Microanalysis 23(S1), 1044–1045.Google Scholar
[2] Brodusch, N., Demers, H.
Gauvin, R. (2018) Scanning Electron Microscopy, New Perspectives in Materials Characterization. Springer.Google Scholar
You have
Access