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Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Petzold, S, Zintler, A, et al. ., Adv. Electron. Mater. 10 (2019) 10.1002/aelm.201900484Google Scholar
Borodinov, N., Neumayer, , et al. npj Comput Mater 5, 25 (2019). 10.1038/s41524-019-0148-5Google Scholar
The authors acknowledge financial support from the Deutsche Forschungsgemeinschaft (DFG) under research grant MO 3010/3-1 and the European Research Council (ERC) “Horizon 2020” Program under Grant No. 805359-FOXON.Google Scholar
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