Hostname: page-component-84b7d79bbc-2l2gl Total loading time: 0 Render date: 2024-07-28T08:16:35.962Z Has data issue: false hasContentIssue false
  • English
  • Français

The Many Connections Between Atom Probe and Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Thomas F. Kelly
Thomas F. Kelly*
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1032 - 1033
Copyright
© Microscopy Society of America 2017 

References

[1] Friedrich, W, Knipping, P & von Laue, M Sitzungber K Bayer Akad Wiss 1912 1912). p. 303.Google Scholar
[2] Friedrich, W, Knipping, P & von Laue, M Radium 10 1913). p. 47.CrossRefGoogle Scholar
[3] de Broglie, L Nature 112 1923). p. 540.CrossRefGoogle Scholar
[4] Busch, H Arch. Elektrotechnik. 18 1927). p. 583.Google Scholar
[5] Bahadur, K Ph. D. Thesis, The Pennsylvania State University 1955.Google Scholar
[6] Müller, EW & Bahadur, K Phys. Rev. 102(no. 3 1956). p. 624.Google Scholar
[7] Crewe, AV, Wall, J & Langmore, J Science 168(no. 3937 1970). p. 1338.Google Scholar
[8] Young, RD Phys. Today 24(no. 11 Nov. 1971). p. 42.Google Scholar
[9] Chen, Y, et al., Microsc. Microanal. 22(no. S3 2016). p. 682.Google Scholar
[10] Kelly, TF Microsc. Microanal. 23 2017). p. 34.Google Scholar