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Mapping Magnetic Ordering With Aberrated Electron Probes in STEM

Published online by Cambridge University Press:  25 July 2016

Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Ján Rusz
Affiliation:
Department of Physics and Astronomy, Uppsala University, P.O. Box 516, Uppsala, Sweden
Jakob Spiegelberg
Affiliation:
Department of Physics and Astronomy, Uppsala University, P.O. Box 516, Uppsala, Sweden
Michael A. McGuire
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Christopher T. Symons
Affiliation:
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Ranga Raju Vatsavai
Affiliation:
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Claudia Cantoni
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rusz, J., Idrobo, J. C. & Bhowmick, S. Phys. Rev. Lett. 113 (2014). p. 145501.CrossRefGoogle Scholar
[2] Idrobo, J.C., et al, submitted (2016).Google Scholar
[3] Krivanek, O. L., et al, Ultramicroscopy 108 (2008). p. 179195.CrossRefGoogle Scholar
[4] Research supported by Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility (JCI), by the Swedish Research Council and Swedish National Infrastructure for Computing (NSC center) (JR), and by the Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. DOE (MAM, CC, ARL), and by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy (CTS, RRV).Google Scholar