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Mass-Thickness Measurements in the TEM via EDS: A New Approach to Quantitative Chemical Analysis of Planetary Materials?
Published online by Cambridge University Press: 01 August 2018
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2084 - 2085
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- © Microscopy Society of America 2018
References
[8] We gratefully acknowledge NASA (grants #NNX12AL47G and #NNX15AJ22G) and NSF (grants #1531243 and #0619599) for funding of instrumentation in the Kuiper Materials Imaging and Characterization Facility at the Lunar and Planetary Laboratory, University of Arizona. Research supported by NASA grant #NNX15AJ22G.Google Scholar
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