Hostname: page-component-5c6d5d7d68-ckgrl Total loading time: 0 Render date: 2024-09-01T09:22:56.105Z Has data issue: false hasContentIssue false
  • English
  • Français

Maximum thicknesses of EELS log ratio thickness measurement for several elements

Published online by Cambridge University Press:  30 July 2021

Misa Hayashida  and
Marek Malac
Misa Hayashida
Affiliation:
National Research of Council, Edmonton, Alberta, Canada
Marek Malac
Affiliation:
National Research of Council, Alberta, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 716 - 718
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Malis, T., Cheng, S.C., Egerton, R.F., EELS Log-ratio technique for specimen-thickness measurement in the TEM, Journal of Electron Microscopy Technique, 8 (1988) 193-200.CrossRefGoogle ScholarPubMed
Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope, 2 ed., Plenum Press, New York, 1996.Google Scholar
Hosoi, J., Oikawa, T., Inoue, M., Kokubo, Y., Hama, K., Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysis, Ultramicroscopy, 7 (1981) 147-153.CrossRefGoogle ScholarPubMed
Oh-Ishi, K., Ohsuna, T., Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen, Ultramicroscopy, 212 (2020) 112955.Google ScholarPubMed
Meltzman, H., Kauffmann, Y., Thangadurai, P., Drozdov, M., Baram, M., Brandon, D., Kaplan, W.D., An experimental method for calibration of the plasmon mean free path, J. Microsc., 236 (2009) 165-173.Google ScholarPubMed
Potapov, P.L., The experimental electron mean-free-path in Si under typical (S)TEM conditions, Ultramicroscopy, 147 (2014) 21-24.CrossRefGoogle Scholar
Mitchell, D.R.G., Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping a case study using Si and P91 steel, Journal of Microscopy, 224 (2006) 187-196.Google ScholarPubMed
Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., Furuya, K., Thickness Measurements With Electron Energy Loss Spectroscopy, Microsc. Res. Tech., 71 (2008) 626-631.CrossRefGoogle ScholarPubMed
Iakoubovskii, K., Mitsuishi, K., Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior, PHYSICAL REVIEW B, 77 (2008) 104102.Google Scholar
Zhang, P., Wang, Z., Perepezko, J.H., Voyles, P.M., Elastic and inelastic mean free paths of 200keV electrons in metallic glasses, Ultramicroscopy, 171 (2016) 89-95.CrossRefGoogle ScholarPubMed
Schweiss, D.T., Hwang, J., Voyles, P.M., Inelastic and elastic mean free paths from FIB samples of metallic glasses, Ultramicroscopy, 124 (2013) 6-12.CrossRefGoogle ScholarPubMed