MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

R Gauvin; P Michaud

doi:10.1017/S1431927609092423

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Demers, Hendrix Poirier‐Demers, Nicolas Couture, Alexandre Réal Joly, Dany Guilmain, Marc de Jonge, Niels and Drouin, Dominique 2011. Three‐dimensional electron microscopy simulation with the CASINO Monte Carlo software. Scanning, Vol. 33, Issue. 3, p. 135.

Gauvin, Raynald 2012. What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?. Microscopy and Microanalysis, Vol. 18, Issue. 5, p. 915.

Brodusch, Nicolas Trudeau, Michel Michaud, Pierre Rodrigue, Lisa Boselli, Julien and Gauvin, Raynald 2012. Contribution of a New Generation Field-Emission Scanning Electron Microscope in the Understanding of a 2099 Al-Li Alloy. Microscopy and Microanalysis, Vol. 18, Issue. 6, p. 1393.

BRODUSCH, N. DEMERS, H. and GAUVIN, R. 2013. Nanometres‐resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope. Journal of Microscopy, Vol. 250, Issue. 1, p. 1.

Wuhrer, R and Moran, K 2014. Quantitative X-ray mapping, scatter diagrams and the generation of correction maps to obtain more information about your material. IOP Conference Series: Materials Science and Engineering, Vol. 55, Issue. , p. 012021.

GUINEL, M.J.‐F. BRODUSCH, N. SHA, G. SHANDIZ, M.A. DEMERS, H. TRUDEAU, M. RINGER, S.P. and GAUVIN, R. 2014. Microscopy and microanalysis of complex nanosized strengthening precipitates in new generation commercial Al–Cu–Li alloys. Journal of Microscopy, Vol. 255, Issue. 3, p. 128.

Brodusch, Nicolas Waters, Kristian Demers, Hendrix and Gauvin, Raynald 2014. Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore. Microscopy Research and Technique, Vol. 77, Issue. 3, p. 225.

Brodusch, Nicolas Zaghib, Karim and Gauvin, Raynald 2015. Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling. Microscopy Research and Technique, Vol. 78, Issue. 1, p. 30.

Hovington, Pierre Timoshevskii, Vladimir Burgess, Simon Demers, Hendrix Statham, Peter Gauvin, Raynald and Zaghib, Karim 2016. Can we detect Li K X‐ray in lithium compounds using energy dispersive spectroscopy?. Scanning, Vol. 38, Issue. 6, p. 571.

Demers, Hendrix MacRae, Colin M. Wilson, Nicholas C. Hovington, Pierre Timoshevskii, Vladimir Gauvin, Raynald and Zaghib, Karim 2016. Determination of Soft X-ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis. Microscopy and Microanalysis, Vol. 22, Issue. S3, p. 408.

Dorri, Mahrokh Turgeon, Stéphane Brodusch, Nicolas Cloutier, Maxime Chevallier, Pascale Gauvin, Raynald and Mantovani, Diego 2016. Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction. Microscopy and Microanalysis, Vol. 22, Issue. 5, p. 997.

Zachman, Michael J. Asenath-Smith, Emily Estroff, Lara A. and Kourkoutis, Lena F. 2016. Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-FreeIn SituLocalization and Cryo-Focused Ion Beam Lift-Out. Microscopy and Microanalysis, Vol. 22, Issue. 6, p. 1338.

Teng, Chaoyi Demers, Hendrix Brodusch, Nicolas and Gauvin, Raynald 2017. The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 1046.

Brodusch, Nicolas Demers, Hendrix and Gauvin, Raynald 2017. Quantification of Thin Specimens in a Scanning Transmission Electron Microscope at Low Accelerating Voltage using the f-ratio Method. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 236.

Yuan, Yu Demers, Hendrix and Gauvin, Raynald 2017. The Fluorescence Correction of Multilayer Materials for Quantitative X-ray Microanalysis. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 218.

Kikongi, Philippe Demers, Hendrix Gauvin, Raynald Gosselin, Ryan and Braidy, Nadi 2017. Mapping Data with Heavily Overlapped Spectral Features. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 216.

BRODUSCH, NICOLAS and GAUVIN, RAYNALD 2017. The qualitative f‐ratio method applied to electron channelling‐induced x‐ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission mode. Journal of Microscopy, Vol. 267, Issue. 3, p. 288.

Rudinsky, Samantha Brodusch, Nicolas and Gauvin, Raynald 2018. Monte Carlo Simulation of Surface Semi-Spherical Inclusions Using MC X-ray. Microscopy and Microanalysis, Vol. 24, Issue. S1, p. 740.

Brodusch, Nicolas Demers, Hendrix and Gauvin, Raynald 2018. Field Emission Scanning Electron Microscopy. p. 55.

Teng, Chaoyi Demers, Hendrix and Gauvin, Raynald 2018. The Standard-based f-ratio Quantitative X-Ray Microanalysis Method for a Field Emission SEM. Microscopy and Microanalysis, Vol. 24, Issue. S1, p. 732.

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MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

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